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Considerations relating to corrosion resistance are outside the scope of the present Standard
This test method uses SI units
The target of this Test Method is to characterize silicon wafers: that is
SEMI MF28-0317 (technical revision)
Loading and unloading is assumed to take place in semi-automated and automated mode by using any kind of system or device (e
PV06600 - SEMI PV66 - Test Method for Determining the Aspect Ratio of Solar Cell Metal Fingers by Confocal Laser Scanning Microscope StdPbc-0526 Considerations relating to corrosion resistanceThe purpose of this Standard is to standardize a fast and accurate test method for determining the aspect ratio of solar cell metal fingers by confocal laser scanning microscope (CLSM). This Standard defines the test method for determining the aspect ratio of solar cell metal finger. This Standard applies to test the aspect ratio of solar cell metal finger by CLSM. Referenced SEMI Standards (purchase separately) None. Revision History SEMI PV66 0715